A Framework to Calibrate the Scanning Electron Microscope under Variational Magnifications
Title: | A Framework to Calibrate the Scanning Electron Microscope under Variational Magnifications |
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Kind : | Journal Papers |
Published In: | IEEE Photonics Technology Letters, January |
Year : | 2016 |
Authors : |
X. Liu Z. Li Pedro Miraldo K. Zhong Y. Shi |
Lab : | Intelligent Robots and Systems Group (IRSg) |
File : | Open File |