Title: Generic distortion model for metrology under optical microscopes
Kind : Journal Papers
Published In: Optics and Lasers in Engineering, Vol. 103, pp. 119-126, April
URL : https://www.sciencedirect.com/science/article/pii/S0143816617307856#!
Year : 2018
Authors : X. Liu
Z. Li
K. Zhong
YuhJin Chao
Pedro Miraldo
Y. Shi
Lab : Intelligent Robots and Systems Group (IRSg)