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A Framework to Calibrate the Scanning Electron Microscope under Variational Magnifications
Title: A Framework to Calibrate the Scanning Electron Microscope under Variational Magnifications
Kind : Journal Papers
Published In: IEEE Photonics Technology Letters, January
Year : 2016
Authors : X. Liu
Z. Li
Pedro Miraldo
K. Zhong
Y. Shi
Lab : Intelligent Robots and Systems Group (IRSg)
File : Open File

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